ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2015/08 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | Gaseous tritium uptake by C deposition layer on tungsten |
執筆形態 | 共著・編著(代表編著を除く) |
掲載誌名 | JOURNAL OF NUCLEAR MATERIALS |
出版社・発行元 | ELSEVIER SCIENCE BV |
巻・号・頁 | 463,pp.1017-1020 |
国際共著 | 国際共著 |
著者・共著者 | Y. Hamaji,H. T. Lee,Y. Torikai,K. Sugiyama,Y. Ueda |
概要 | Tritium (T) uptake by exposure to gaseous T on deuterated C deposition layer on W was investigated. The C deposition layer were prepared by mixed D and C ion irradiation. The specimens were exposed to D an T mixed gas at 423 and 573 K. The additional T retention by gas exposure at 573 K was about 4 times higher than that by gas exposure at 423 K. Further heating from 573 to 673 K in vacuum after the gas exposure, resulted in more than 70% of retained T stayed after heating at 673 K. That should be due to changing of nature of trap sites in C deposition layer during experiments. These results suggest that additional T trapped in such trap sites require higher temperature to remove retained T in such trap sites. (C) 2014 Elsevier B.V. All rights reserved. |
DOI | 10.1016/j.jnucmat.2014.11.052 |
ISSN | 0022-3115/1873-4820 |