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ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 1997/08 |
| 形態種別 | 論文 |
| 査読 | 査読あり |
| 標題 | Erosion of pyrolytic graphite and Ti-doped graphite due to high flux irradiation |
| 執筆形態 | 共著・編著（代表編著を除く） |
| 掲載誌名 | JOURNAL OF NUCLEAR SCIENCE AND TECHNOLOGY |
| 掲載区分 | 国外 |
| 出版社・発行元 | TAYLOR & FRANCIS LTD |
| 巻・号・頁 | 34(8),pp.792-798 |
| 著者・共著者 | Y Ohtsuka,JP Ohashi,K Ueda,M Isobe,M Nishikawa |
| 概要 | The erosion of pyrolytic graphite and titanium doped graphite RG-Ti above 1,780K was investigated by 5 keV Ar beam irradiation with the flux from 4x10(19) to 1x10(21) m(-2).s(-1). The total erosion S yields were significantly reduced with the au?c. This reduction would be attributed to the reduction of RES (radiation enhanced sublimation) yield, which was observed in the case of isotropic graphite with the flux dependence of RES yield of phi(-0.26) (phi: flux) Obtained in our previous work. The yield of pyrolytic graphite was roughly 30% higher than that of isotropic graphite below the flux of 10(20) m(-2).s(-1) whereas each yield approached to very close value at the highest flux of 1x10(21)m(-2).s(-1). This result indicated that the effect of graphite structure on the RES yield, which was apparent in the low flux region, would disappear in the high Bur region probably due to the disordering of crystal structure. |
| DOI | 10.1080/18811248.1997.9733743 |
| ISSN | 0022-3131/1881-1248 |
| NAID | 10002077748 |