イノウエ リョウタロウ
井上 亮太郎 所属 追手門学院大学 理工学部 電気電子工学科 職種 准教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2005 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | Effect of thermal expansion in microwave conductivity measurement |
掲載誌名 | PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS |
出版社・発行元 | ELSEVIER SCIENCE BV |
巻・号・頁 | 426(1),pp.240-245 |
著者・共著者 | T Ohashi,H Kitano,A Maeda,R Inoue |
概要 | Systematic investigation was performed experimentally on the effect of the thermal expansion of the samples in the microwave-surface-impedance measurement by the resonant technique, using conventional superconductors, Pb and Nb, with various sample sizes. The measurement of the surface reactance, X-S, was found to be very sensitive to the thermal expansion, whereas that of the surface resistance, R-S, was insensitive. We propose a new relation between the measured experimental data and the surface impedance, to deal with this problem. We also propose a quantity which represents the degree of the thermal expansion in the microwave measurement. (c) 2005 Elsevier B.V. All rights reserved. |
DOI | 10.1016/j.physc.2005.02.035 |
ISSN | 0921-4534 |