ウエダ　ヨシオ   Ueda Yoshio   上田　良夫    所属   追手門学院大学  理工学部 電気電子工学科    職種   教授
言語種別	英語
発行・発表の年月	2003/09
形態種別	論文
査読	査読あり
標題	Mechanism of blister formation on tungsten surface
執筆形態	共著・編著（代表編著を除く）
掲載誌名	FUSION ENGINEERING AND DESIGN
掲載区分	国外
出版社・発行元	ELSEVIER SCIENCE SA
巻・号・頁	66-68,pp.247-251
著者・共著者	T Shimada,Y Ueda,M Nishikawa
概要	Mechanism of blister formation by ion beam irradiation on tungsten surface was investigated by changing the carbon concentration of 0.07-1.00%, beam fluence of 10(22)-10(25) m(-2) at beam energy and sample temperature of 1.0 keV and 653 K, respectively. When the carbon concentration was between 0.15 and 0.35%, a small number of blisters were observed in the irradiated region. When the carbon concentration was more than 0.35%, a large number of blisters with various sizes were observed all around the surface. Threshold value of beam fluence for the blister formation was around 3.0 x 10(23) m(-2) at a carbon concentration of 0.70-1.00%. Blisters with a number of about 6 mm(-2) were observed at the fluence of 3.1 x 10(23) m(-2).
DOI	10.1016/S0920-3796(03)00294-1
ISSN	0920-3796