ウエダ　ヨシオ   Ueda Yoshio   上田　良夫    所属   追手門学院大学  理工学部 電気電子工学科    職種   教授
言語種別	英語
発行・発表の年月	2004/08
形態種別	論文
査読	査読あり
標題	Effect of tungsten microstructure on blister formation by hydrogen and carbon mixed ion beam irradiation
執筆形態	共著・編著（代表編著を除く）
掲載誌名	JOURNAL OF NUCLEAR MATERIALS
掲載区分	国外
出版社・発行元	ELSEVIER SCIENCE BV
巻・号・頁	329,pp.780-784
著者・共著者	T Funabiki,T Shimada,Y Ueda,M Nishikawa
概要	Characteristics of blister formation for different types of tungsten (stress relieved W, recrystallized W, K-doped W, and La2O3-doped W) were studied by hydrogen and carbon mixed ion beam irradiation (1 keV H-3(+)). In the carbon concentration in the ion beam of similar to0.1%, no significant blisters were formed on the surface. However, many blisters of various sizes (from 1.0 mum to several hundred mum) were formed with carbon concentration of similar to0.7%. These characteristics were observed for all samples. For the stress relieved W and K-doped W, blisters are round shapes, whose sizes ranged from 1 mum to several hundred mum in diameter. For the recrystallized W and La2O3-doped W, blisters are irregular shapes, whose sizes are almost the same from 20 to 50 mum in diameter. These similarities in blister shapes could be related to microstructure of the samples. (C) 2004 Elsevier B.V. All rights reserved.
DOI	10.1016/j.jnucmat.2004.04.174
ISSN	0022-3115