ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
|
言語種別 | 英語 |
発行・発表の年月 | 2009/06 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | Deuterium trapping in tungsten damaged by high-energy hydrogen ion irradiation |
執筆形態 | 共著・編著(代表編著を除く) |
掲載誌名 | JOURNAL OF NUCLEAR MATERIALS |
出版社・発行元 | ELSEVIER SCIENCE BV |
巻・号・頁 | 390-91,pp.572-575 |
著者・共著者 | M. Fukumoto,H. Kashiwagi,Y. Ohtsuka,Y. Ueda,M. Taniguchi,T. Inoue,K. Sakamoto,J. Yagyu,T. Arai,I. Takagi,T. Kawamura |
概要 | Effects of radiation damage on deuterium trapping in tungsten were investigated using SiMS/NRA and TDS techniques. Radiation damage of similar to 4.8 dpa was produced by 300 and 700 keV hydrogen ions, then deuterium ions were implanted at 473 K to fluences of 0.5-8.0 x 10(24) D(+)/m(2). Deuterium concentration at -0.1 mu m in depth was saturated at the lowest fluence (-5.0 x 10(23) D(+)/m(2)), while the D retention at -1.0 mu m deep was not saturated at the highest fluence of -8.0 x 10(24) D(+)/m(2). On the other hand, deuterium behavior Simulated by the TMAP7 code showed that the defects were filled with the implanted D from the top surface and all of the traps were filled at the fluence of similar to 7.5 x 10(22) D(+)/m(2), which was much lower than the fluences in this experiment. TDS spectra suggested that the implanted D was trapped at the radiation-induced defects which had desorption peaks at similar to 770 and similar to 920 K. (C) 2009 Elsevier B.V. All rights reserved. |
DOI | 10.1016/j.jnucmat.2009.01.107 |
ISSN | 0022-3115 |