ウエダ　ヨシオ   Ueda Yoshio   上田　良夫    所属   追手門学院大学  理工学部 電気電子工学科    職種   教授
言語種別	英語
発行・発表の年月	2007
形態種別	論文
査読	査読あり
標題	Multi-path method by using shear horizontal wave for defect size detection
執筆形態	共著・編著（代表編著を除く）
掲載誌名	PRZEGLAD ELEKTROTECHNICZNY
掲載区分	国外
出版社・発行元	WYDAWNICTWO SIGMA - N O T
巻・号・頁	83(11),pp.191-193
著者・共著者	Yusuke Ohtsuka,Naoki Nakamura,Masahiro Nishikawa,Yoshio Ueda
概要	A new method to determine the defect size by the estimation of the multi-path signals was proposed. In this method, two parameters were determined from the amplitude variations of the received waves through the multi-path. As a result, the real defect depths of 3 mm and 5 mm were evaluated as 3.2 mm and 4.6 mm from dy/dx of the fitting lines by least-squares method. Both results were achieved within maximum error of 10 % of the thickness reduction.
ISSN	0033-2097