ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2018/08 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | Surface morphology changes of silicon carbide by helium plasma irradiation |
執筆形態 | 共著・編著(代表編著を除く) |
掲載誌名 | NUCLEAR MATERIALS AND ENERGY |
出版社・発行元 | ELSEVIER SCIENCE BV |
巻・号・頁 | 16,pp.145-148 |
著者・共著者 | N. Yamashita,K. Omori,Y. Kimura,T. Hinoki,K. Ibano,H. T. Lee,Y. Ueda |
概要 | Silicon carbide (SiC) and its composites are candidate materials for the blanket components and for the first wall in a fusion reactor. If the SiC is used without any armor materials for the first wall, it is exposed by helium (He) plasma as well as hydrogen plasma. Characteristic surface morphology changes are reported for various materials by He plasma exposure. Thus, we exposed SiC specimens to He or simultaneous deuterium (D) and He (D + He) plasma by various conditions and then observed surface morphology changes by SEM. As a result, needle-like structures and whiskers-like structures at the tip were formed in He plasma and D + He irradiation, while only needle-like structures were formed in D plasma. Therefore, it indicated that the effects of He were attributed to form whiskers-like structures. |
DOI | 10.1016/j.nme.2018.06.013 |
ISSN | 2352-1791/2352-1791 |