ウエダ　ヨシオ   Ueda Yoshio   上田　良夫    所属   追手門学院大学  理工学部 電気電子工学科    職種   教授
言語種別	英語
発行・発表の年月	2011/11
形態種別	論文
査読	査読あり
標題	EFFECTS OF STEADY-STATE PLASMA EXPOSURE ON TUNGSTEN SURFACE CRACKING DUE TO ELM-LIKE PULSED PLASMA BOMBARDMENT
執筆形態	共著・編著（代表編著を除く）
掲載誌名	FUSION SCIENCE AND TECHNOLOGY
掲載区分	国外
出版社・発行元	AMER NUCLEAR SOC
巻・号・頁	60(4),pp.1447-1450
国際共著	国際共著
著者・共著者	D. Nishijima,Y. Kikuchi,M. Nakatsuka,M. J. Baldwin,R. P. Doerner,M. Nagata,Y. Ueda
概要	Sequential exposures of W surfaces to steady-state and pulsed (similar to 0.5 ms) plasmas have been performed in a linear divertor plasma simulator and a magnetized coaxial plasma gun to investigate effects of D blisters, nano-sized He bubbles, and He-induced W fuzz on surface cracking by pulsed plasma loads. Surface cracks appeared on samples containing D blisters or He bubbles following 10 shots at similar to 0.5 MJ/m(2) per shot, while a mirror-polished sample with no pre-plasma exposure did not exhibit cracks after similar transient exposures. Note that the cracking is limited to the edge region for a sample with D blisters. This means that the energy density threshold for surface cracking is lowered by the existence of D blisters and, especially, He bubbles. On the other hand, it is found that fuzzy surfaces possess a good resistance to surface cracking, although arcing is prone to occur.
DOI	10.13182/FST11-A12703
ISSN	1536-1055