ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2013/05 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | STRUCTURE OF C DEPOSITION LAYERS UNDER VARIOUS DEPOSITION CONDITIONS |
執筆形態 | 共著・編著(代表編著を除く) |
掲載誌名 | FUSION SCIENCE AND TECHNOLOGY |
掲載区分 | 国外 |
出版社・発行元 | AMER NUCLEAR SOC |
巻・号・頁 | 63(1T),pp.371-373 |
国際共著 | 国際共著 |
著者・共著者 | Y. Hamaji,T. Wada,H. T. Lee,Y. Ohtsuka,Y. Ueda,A. Kreter,V. Philipps,Y. Yamauchi,N. Ashikawa |
概要 | The structure of deposited carbon layers formed under various conditions ranging from small scale laboratory to large scale magnetic confinement devices was characterized using Raman spectroscopy. By comparing ion beam and TEXTOR experiments, the deposition temperature is found to be the dominant factor in three dimensional disorder of sp2 sites and sp3 ratio at T>493 K. While, no clear temperature dependence on properties of aromatic rings was observed, indicating other parameters responsible for the aromatic rings present in carbon deposition layers. The carbon layers from JET differed significantly, indicating influence of Be compound formation on Raman parameters. |
DOI | 10.13182/FST13-A16958 |
ISSN | 1536-1055/1943-7641 |