ウエダ ヨシオ   Ueda Yoshio
  上田 良夫
   所属   追手門学院大学  理工学部 電気電子工学科
   職種   教授
言語種別 英語
発行・発表の年月 2014
形態種別 論文
査読 査読あり
標題 Deuterium retention in various toughened, fine-grained recrystallized tungsten materials under different irradiation conditions
執筆形態 共著・編著(代表編著を除く)
掲載誌名 Physica Scripta
掲載区分国外
出版社・発行元 Institute of Physics Publishing
巻・号・頁 T159
著者・共著者 M. Oya,H. T. Lee,Y. Ohtsuka,Y. Ueda,H. Kurishita,M. Oyaidzu,T. Yamanishi
概要 Deuterium retention in two types of toughened, fine-grained recrystallized W (TFGR W-1.2 wt% titanium carbide (TiC) and TFGR W-3.3 wt% tantalum carbide (TaC)) was studied, compared to pure W. D plasma exposure was performed to a fluence of 1 × 1026 D m-2 at a temperature of 573 K, followed by retention measurement analysis by nuclear reaction analysis and thermal desorption spectroscopy (TDS). It is found that D retention in TFGR W is higher than that in pure W. This is because TFGR W has a high density of trapping sites with low trapping energy and dispersoid (TiC or TaC) may serve as additional trapping sites with high trapping energy. Different irradiation experiments (D ion beam implantation) were also conducted at sample temperatures of 473-873 K, followed by TDS. At higher sample temperature (&gt
700 K), D retention in TFGR W-3.3 wt% TaC is lower than that in TFGR W-1.2 wt% TiC. This may be due to different types of dispersoids. © 2014 The Royal Swedish Academy of Sciences.
DOI 10.1088/0031-8949/2014/T159/014048
ISSN 0281-1847