ウエダ ヨシオ
Ueda Yoshio
上田 良夫 所属 追手門学院大学 理工学部 電気電子工学科 職種 教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2014/04 |
形態種別 | 論文 |
査読 | 査読あり |
標題 | Deuterium retention in various toughened, fine-grained recrystallized tungsten materials under different irradiation conditions |
執筆形態 | 共著・編著(代表編著を除く) |
掲載誌名 | PHYSICA SCRIPTA |
掲載区分 | 国内 |
出版社・発行元 | IOP PUBLISHING LTD |
巻・号・頁 | T159 |
著者・共著者 | M. Oya,H. T. Lee,Y. Ohtsuka,Y. Ueda,H. Kurishita,M. Oyaidzu,T. Yamanishi |
概要 | Deuterium retention in two types of toughened, fine-grained recrystallized W (TFGR W-1.2 wt% titanium carbide (TiC) and TFGR W-3.3 wt% tantalum carbide (TaC)) was studied, compared to pure W. D plasma exposure was performed to a fluence of 1 x 10(26) D m(-2) at a temperature of 573 K, followed by retention measurement analysis by nuclear reaction analysis and thermal desorption spectroscopy (TDS). It is found that D retention in TFGR W is higher than that in pure W. This is because TFGR W has a high density of trapping sites with low trapping energy and dispersoid (TiC or TaC) may serve as additional trapping sites with high trapping energy. Different irradiation experiments (D ion beam implantation) were also conducted at sample temperatures of 473-873 K, followed by TDS. At higher sample temperature (>700 K), D retention in TFGR W-3.3 wt% TaC is lower than that in TFGR W-1.2 wt% TiC. This may be due to different types of dispersoids. |
DOI | 10.1088/0031-8949/2014/T159/014048 |
ISSN | 0031-8949/1402-4896 |
Put Code(ORCID) | 49208338 |
PermalinkURL | http://www.scopus.com/inward/record.url?eid=2-s2.0-84902213543&partnerID=MN8TOARS |
researchmap用URL | http://orcid.org/0000-0002-7720-4023 |